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filingDate 2021-07-20-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2022-01-18-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-113948451-A
titleOfInvention Method of forming semiconductor device
abstract In a method of forming a semiconductor device, a metal adhesion layer can be formed on the bottom and sidewalls of the trench before forming the metal plug in the trench. Plasma can be used to alter the phase composition of the metal adhesion layer to increase the adhesion between the metal adhesion layer and the metal plug. In particular, the plasma can cause a shift or transformation of the phase composition of the metal adhesion layer such that the metal adhesion layer becomes composed of the main phase (111). The main phase (111) of the metal adhesion layer increases the adhesion of the metal adhesion layer.
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