http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112713086-A

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-3065
filingDate 2019-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4f0f0a80ceacc87bb1b1ec15711d4dea
publicationDate 2021-04-27-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-112713086-A
titleOfInvention Semiconductor structure and forming method thereof
abstract A semiconductor structure and a forming method thereof are provided, wherein the forming method comprises the following steps: providing a layer to be etched; forming a precursor layer on the layer to be etched; annealing the precursor layer to form a plurality of mutually separated initial first mask layers and second mask layers on the precursor layer, wherein the second mask layers are positioned between the adjacent initial first mask layers; modifying the initial first mask layer to form a first mask layer; and etching to remove the second mask layer, wherein the etching rate of the process for etching to remove the second mask layer on the material of the first mask layer is less than the etching rate of the material of the initial first mask layer. The performance of the formed semiconductor structure is improved.
priorityDate 2019-10-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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