http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-106463392-A

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filingDate 2015-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2017-02-22-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-106463392-A
titleOfInvention Cooled creel stand with thermal management for dicing during plasma dicing
abstract Methods and apparatus for dicing semiconductor wafers with each wafer having a plurality of integrated circuits are described. In an example, the plasma etch chamber includes a plasma source disposed in an upper region of the plasma etch chamber. The plasma etch chamber also includes a cathode assembly disposed below the plasma source. The cathode assembly includes a cooled RF powered chuck for supporting the inner portion of the back side of the substrate carrier. The cathode assembly also includes a cooling RF isolation support that surrounds but is isolated from the RF powered chuck. The RF isolated support is used to support the outer portion of the backside of the substrate carrier.
priorityDate 2014-05-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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