Predicate |
Object |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-73 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-32225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-48 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-24195 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-181 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-04105 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-48227 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-73267 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-16225 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-00014 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-73265 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-48091 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-15153 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-3025 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2224-24227 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-01029 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-82 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L24-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-5389 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L25-16 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-60 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-48 |
filingDate |
2011-05-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
grantDate |
2017-08-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationDate |
2017-08-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
CN-104332417-B |
titleOfInvention |
The preparation method of built-in type semiconductor package |
abstract |
The present invention discloses a kind of preparation method of built-in type semiconductor package.The semiconductor package part includes semiconductor element, top patterned conductive layer, the dielectric layer between top patterned conductive layer and semiconductor element, the first inner layer electrical articulamentum, underlying patterned conductive layer, via hole and the second inner layer electrical articulamentum with electrical contact.Dielectric layer has the first opening for exposing electrical contact and patterned conductive layer extends to the second opening of top patterned conductive layer from below.The first inner layer electrical articulamentum extends to top patterned conductive layer from electrical contact and is filled in the first opening.Second opening has the upper part for exposing top patterned conductive layer and the lower part for exposing underlying patterned conductive layer.Via hole is located at the lower part of the second opening.Second inner layer electrical articulamentum is filled in the upper part of the second opening. |
priorityDate |
2010-12-17-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |