http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102683270-B

Outgoing Links

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classificationCPCAdditional http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-0002
classificationCPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76873
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76879
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76867
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-485
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76883
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L23-53238
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76846
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76847
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L21-76849
classificationIPCInventive http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L23-522
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-768
filingDate 2012-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2017-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationDate 2017-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-102683270-B
titleOfInvention Method, semi-conductor device manufacturing method and semiconductor devices
abstract A kind of method, semi-conductor device manufacturing method and semiconductor devices.Wherein method, semi-conductor device manufacturing method includes:Being formed on the basal surface and side wall for forming the opening portion on interlayer dielectric and in the field portion on the interlayer dielectric in addition to opening portion includes the seed crystal film of the first metal;Resist is formed on seed crystal film and opening portion is filled with the resist;A part of resist is removed, while being retained in the resist on the seed crystal film formed on the basal surface of opening portion;The seed crystal film that exposure is formed on the top and field portion of the side wall of opening portion;Being formed on seed crystal film on the top positioned at the side wall of opening portion and in the portion of field includes bimetallic cover layer, and the bimetallic resistivity is higher than the resistivity of the first metal;By remove resist and exposed seed epitaxial;And formation includes the plated film of the first metal on exposed seed crystal film.
priorityDate 2011-03-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2001023925-A
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID412550040
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http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID23978
http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID935

Total number of triples: 27.