http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-102318037-B

Outgoing Links

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http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-027
filingDate 2008-12-09-04:00^^<http://www.w3.org/2001/XMLSchema#date>
grantDate 2014-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_66b27893b6bb424745426e70dd8e87ae
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_213773bc41a5a5784ada3c2acc14425f
publicationDate 2014-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber CN-102318037-B
titleOfInvention CD bias loading control with ARC layer open
abstract A method for etching a line pattern in an etch layer disposed below an antireflective coating (ARC) layer below a patterned mask is provided. The method includes opening the ARC layer, in which an ARC opening gas comprising CF3I, a fluorocarbon (including hydrofluorocarbon) containing gas, and an oxygen containing gas are provided, a plasma is formed from the ARC opening gas to open the ARC layer, and providing the ARC opening gas is stopped. Line pattern features are etched into the etch layer through the opened ARC layer.
priorityDate 2007-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 24.