http://rdf.ncbi.nlm.nih.gov/pubchem/reference/29590012

Outgoing Links

Predicate Object
contentType Journal Article
endingPage 3354
issn 1533-4880
1533-4899
issueIdentifier 4
pageRange 3350-3354
publicationName Journal of Nanoscience and Nanotechnology
startingPage 3350
bibliographicCitation Hwang SM, Lee SM, Choi JH, Park K, Joo J, Lim JH, Kim H. Microstructure and Dielectric Characteristics of High-k Tetragonal ZrO2 Films with Various Thicknesses Processed by Sol–Gel Method. j. nanosci. nanotech. 2012 Apr 01;12(4):3350–4. doi: 10.1166/jnn.2012.5630.
creator http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_49c57c8c2452942dbe24cfacb6afd14a
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_59422fd092497e8139f32df0ea927b3c
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_69613ea66a985513f2f0180a2aa566a5
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_2b72c71812f60e253fc3f153ddb8f24e
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_5a1bb32d825f95d763b3cc0097d77203
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_3ccaa9528c7bdaca5ae660e4443b2aaa
http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_6a421d52778be3711e8cbfa341692de1
date 2012-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date>
identifier https://doi.org/10.1166/jnn.2012.5630
https://pubmed.ncbi.nlm.nih.gov/22849122
isPartOf https://portal.issn.org/resource/ISSN/1533-4899
https://portal.issn.org/resource/ISSN/1533-4880
http://rdf.ncbi.nlm.nih.gov/pubchem/journal/30403
language English
source https://pubmed.ncbi.nlm.nih.gov/
https://www.crossref.org/
title Microstructure and Dielectric Characteristics of High-k Tetragonal ZrO2 Films with Various Thicknesses Processed by Sol–Gel Method

Incoming Links

Predicate Subject
isDiscussedBy http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID129837176

Total number of triples: 27.