reference/209955278

Predicate	Object
contentType	Journal Article
issn	0272-9172 1946-4274
pageRange	a14.2-
publicationName	MRS Proceedings
startingPage	a14.2
bibliographicCitation	Levi DH, Teplin CW, Iwaniczko E, Yan Y, Wang TH, Branz HM. Real-time spectroscopic ellipsometry as an in-situ probe of the growth dynamics of amorphous and epitaxial crystal silicon for photovoltaic applications. MRS Advances. 2005;862():a14.2. doi: 10.1557/proc-862-a14.2.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_3245f4a9564402531e459ebe841328a6 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_dd64c9b2d791e639693fa2307f9ab443 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_196629d6ed0942da2f9dc423017a1d15 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_e4bdb35468874558a3697ed56bd00bda http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_fa444be745030418aed026f27cdf6155 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_396b8e4983a257ae32af688058292499
date	2005
identifier	https://doi.org/10.1557/proc-862-a14.2
isPartOf	http://rdf.ncbi.nlm.nih.gov/pubchem/journal/33231 https://portal.issn.org/resource/ISSN/1946-4274 https://portal.issn.org/resource/ISSN/0272-9172
language	English
source	https://www.crossref.org/ https://scigraph.springernature.com/
title	Real-time spectroscopic ellipsometry as an in-situ probe of the growth dynamics of amorphous and epitaxial crystal silicon for photovoltaic applications

Total number of triples: 22.