reference/18577204

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contentType	Journal Article
endingPage	18
issn	0304-3991
issueIdentifier	1-2
pageRange	5-18
publicationName	Ultramicroscopy
startingPage	5
bibliographicCitation	Delille D, Pantel R, Van Cappellen E. Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fitting. Ultramicroscopy. 2001 Mar;87(1-2):5–18. doi: 10.1016/s0304-3991(00)00067-x. PMID: 11310541.
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date	200103
identifier	https://pubmed.ncbi.nlm.nih.gov/11310541 https://doi.org/10.1016/s0304-3991%2800%2900067-x
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language	English
source	https://pubmed.ncbi.nlm.nih.gov/ https://www.crossref.org/
title	Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fitting
discussesAsDerivedByTextMining	http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID947 http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5461123

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Total number of triples: 23.