reference/14052625

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contentType	Journal Article
endingPage	7785
issn	1520-5126 0002-7863
issueIdentifier	20
pageRange	7764-7785
publicationName	Journal of the American Chemical Society
startingPage	7764
bibliographicCitation	Choi JK, Jang S, Kim KJ, Sohn H, Jeong HD. Observation of negative charge trapping and investigation of its physicochemical origin in newly synthesized poly(tetraphenyl)silole siloxane thin films. J Am Chem Soc. 2011 May 25;133(20):7764–85. doi: 10.1021/ja1108112. PMID: 21542608.
creator	http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_ad889740680dde82c1e98ae5bf4d31f2 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_d393f23186c79a69505e6df8ef3006e4 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_7fc919249ef638a1bc2646e0df6c6682 http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_6d5dd6782eea6cba0a03536944e7184e http://rdf.ncbi.nlm.nih.gov/pubchem/author/MD5_d1969aab2a17d7ba5871b78bd5f01daf
date	2011-05-04-04:00^^<http://www.w3.org/2001/XMLSchema#date>
identifier	https://pubmed.ncbi.nlm.nih.gov/21542608 https://doi.org/10.1021/ja1108112
isPartOf	http://rdf.ncbi.nlm.nih.gov/pubchem/journal/4435 https://portal.issn.org/resource/ISSN/1520-5126 https://portal.issn.org/resource/ISSN/0002-7863
language	English
source	https://pubmed.ncbi.nlm.nih.gov/ https://www.crossref.org/
title	Observation of Negative Charge Trapping and Investigation of Its Physicochemical Origin in Newly Synthesized Poly(tetraphenyl)silole Siloxane Thin Films

Predicate	Subject
isDiscussedBy	http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID127631469 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID246818259 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID246944432

Total number of triples: 27.