http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-9947908-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_dd650884d721ba4439d15c1e1cc53f2e |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B82Y35-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2203-0286 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B3-0021 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N19-00 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-26 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-38 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/B81B3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-416 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01Q60-42 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N19-00 |
| filingDate | 1999-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5e9dd8019192e1aa1747d9e0542013a4 |
| publicationDate | 1999-09-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-9947908-A1 |
| titleOfInvention | Micromechanical potentiometric sensors |
| abstract | A microcantilever potentiometric sensor (1) utilized for detecting and measuring physical and chemical parameters in a sample of media is described. The microcantilevered spring element (3) includes at least one chemical coating (7) on a coated region, that accumulates a surface charge in response to hydrogen ions, redox potential, or ion concentrations in a sample of the media being monitored. The accumulation of surface charge on one surface of the microcantilever (3), with a differing surface charge on an opposing surface, creates a mechanical stress and a deflection of the spring element (3). One of a multitude of deflection detection methods may include the use of a laser light source (17) focused on the microcantilever (3), with a photo-sensitive detector (19) receiving reflected laser impulses. The microcantilevered spring element (3) is approximately 1 to 100 micro-meters long, approximately 1 to 50 micro-meters wide, and approximately 0.3 to 3.0 micro-meters thick. An accuracy of detection of deflections of the cantilever (3) is provided in the range of 0.01 nanometers of deflection. The microcantilever apparatus (1) and a method of detection of parameters require only microliters of a sample to be placed on, or near the spring element (3) surface. The method is extremely sensitive to the detection of the parameters to be measured. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8607619-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009022121-A2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8297110-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2009022121-A3 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-8881578-B2 |
| priorityDate | 1998-03-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 62.