| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_be055db3c1a09879df07379ba969e223
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c95c34a8b7f998e0b221b26556a399f4
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_41ac7ff6ab574ca3737b892da2ebfe6f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ee24205e885efb901b0a27f10954c6b8
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_60a5725ec430ed375a88e314687ebf58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9c8a30191def7d399fcbd0a670d036d9 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y02E60-10 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3835
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H02J7-0048 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H02J7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-30
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-24
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48 |
| filingDate |
1998-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_588966b2cfc30740a3542498bd63aa48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b601ca5c4af3bf52e31f78b99d36a88e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5a1659b214dca038a97bc5e76abd38b6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_71b38c3580ec05deb0f21e15fdd9ac23 |
| publicationDate |
1999-04-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-9917392-A1 |
| titleOfInvention |
Method for measuring residual capacity of secondary cell having nickel hydroxide positive plate |
| abstract |
A method for measuring the residual capacity of a secondary cell, wherein the judging voltage value which is used for judging whether or not the residual capacity of a secondary cell having a nickel hydroxide positive plate in the final stage of discharge reaches an allowable lower limit based on a value (V0) lower than the voltage value (V1) when the residual capacity reaches the allowable limit at the time of first discharge. The value (V0) is determined considering the voltage value (V1) and the voltage value which successively drops due to the memory effect when the residual capacity reaches the allowable lower limit at the second and later discharges. |
| priorityDate |
1997-09-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |