| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_7a28149d25ec315565ff1a09270a3c7a |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11B7-00375
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11B11-10582
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30164 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-9506
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J4-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11B7-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B7-0037
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B11-105 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-95
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J4-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11B7-26 |
| filingDate |
1997-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_88685e6545d520cd73709f9dc835db93
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b99845c1b7e87cdf995227f1b87d90a1 |
| publicationDate |
1998-02-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-9806059-A1 |
| titleOfInvention |
Method and system for detecting localized birefringence defects in a dynamic global birefringence field |
| abstract |
A method and system are provided for reliably detecting localized birefringence defects of an object such as an optical media substrate (10) in a dynamic local birefringence field created during cooling of the optical media substrate at an inspection station (20). A birefringence digital filter (40) filters out high frequency defect data while eliminating background birefringence data in a digital image created by a camera (24) adapted to respond to the birefringence of the optical media substrate under control of a computer (28). Resulting filtered high frequency defect data is then processed to determine the localized birefringence defects in real-time. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6538750-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6292261-B1 |
| priorityDate |
1996-07-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |