Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3a62c92e56568bd104089aac22ca487b |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2851 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31903 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2831 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2834 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-319 |
filingDate |
1996-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_76b8c14a6b8d79145301e2b18385bf7d http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e752c0a6832de4c5850818fd66097519 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d79a204b174d2878120f5af07bbfd0b9 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_93ffef94221b93f971acee8d939d7519 |
publicationDate |
1997-02-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-9705497-A1 |
titleOfInvention |
Method and apparatus for automated wafer level testing and reliability data analysis |
abstract |
Methods and apparatus are disclosed for testing integrated circuits at the wafer level and for integrating test results, calculation of lifetimes and generation of trend charts in a common data base following testing. A wafer tester controller is supplemented with additional hardware and software to avoid data transfer errors and facilitate processing and storage of test results. The data base is available over a network to all areas of an organization. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-6055463-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/TW-I742865-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/FR-2763716-A1 |
priorityDate |
1995-07-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |