http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-9308984-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4e5af887ce5da370d1c2b840f9b51f1b |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/Y10S430-146 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-0036 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G03G19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B33-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01F10-245 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/C30B29-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-82 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02F1-00 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01F10-24 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-82 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G03G19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/C30B33-00 |
| filingDate | 1992-11-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ac098558552dee8d45b24299eb868ffc http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_41b81dcc1ad8c2d882441d4e027ecc57 |
| publicationDate | 1993-05-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-9308984-A1 |
| titleOfInvention | Bistable magneto-optic single crystal films and method of producing same utilizing controlled defect introduction |
| abstract | A bistable single crystal magneto-optic film or preselected coercivity is described. The film is readily switchable and is characterized by a substantially square shaped hysteresis loop. The film properties are attributed to controlled introduction in the film of defects of predetermined size and distribution. Defects of from about 0.4 νm, present in numbers per cm2 of from about 10 to about 106, with optimal distribution falling in the range of from about 100 to about 1000, are described. Also described are methods of achieving the required defect size and distribution utilizing procedures such as ion bombardment, particle abrasion/deposition, laser ablation or annealing of the film or substrate upon which the film is supported. Devices in which the films can be used to advantage, such as flaw detecting, imaging and microwave processing, are described. |
| priorityDate | 1991-11-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.