http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-8303141-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4de9b72409e0ebbfbfe97aa28f8318a6 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07328 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073 |
| filingDate | 1982-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_74b8f622886d6af53822ab82d75b7f60 |
| publicationDate | 1983-09-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-8303141-A1 |
| titleOfInvention | Bed-of-pins test fixture |
| abstract | In-circuit test apparatus for use in performing non-functional electrical inspection of individual components and / or circuit paths in a printed circuit board or wiring assembly on the rear side. The circuit test apparatus described below is cost effective and can be used when testing only small quantities of printed circuit boards. This testing device eliminates the need to drill holes in a support plate. A test head unit (11) and a transition head unit (12) are connected in a modular fashion using assemblies (15) which can be positioned in stacked rows to obtain a two-dimensional series of support support channels (18) tips (13), so as to make a test head for examining a two-dimensional product, and to obtain a two-dimensional series of channels (18) of tip supports (44) so as to make a transition head for connection to an electronic circuit analyzer. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4952872-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0317191-A2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-0317191-A3 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-4851765-A |
| priorityDate | 1982-03-05-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 21.