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filingDate 2021-10-19-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8ad885a0caf9bb694ff31b0921d9cd10
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publicationDate 2022-05-05-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2022092670-A1
titleOfInvention Method for analyzing thickness of brain cortical region
abstract Disclosed according to an embodiment of the present disclosure is a method, for analyzing the thickness of a brain cortical region, performed by a computing device. The method can comprise the steps of: extracting a plurality of boundary surfaces included in a brain cortical region on the basis of a mask generated from a medical image comprising at least one brain region; and estimating the thickness of the brain cortical region on the basis of the plurality of boundary surfaces.
priorityDate 2020-10-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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