| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_268be9afa00cf55b5aa72b1612151ecb |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30132
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20016
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0232
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10028
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0258
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8887
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2291-0289
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10024
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30108 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-069
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N29-0654
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-9515
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-3581
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N22-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N22-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-3581
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 |
| filingDate |
2021-05-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0b90ebfb15815df37bf078e1fe089b05
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5dc5a9900ff7c25fd9b5d7bc8e0fb972
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_df79313024380141085c72df97fbc8d5 |
| publicationDate |
2021-12-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2021241535-A1 |
| titleOfInvention |
Structure inspection method and inspection system |
| abstract |
Provided is a structure inspection method and inspection system capable of efficiently inspecting a structure and performing accurate deterioration prediction. This structure inspection method comprises: a step for acquiring information on an internal damage-containing portion in a region to be inspected; and a step for imaging the region to be inspected using a visible light camera a plurality of times while changing the imaged portion, wherein portions other than the internal damage-containing portion are imaged at a first pixel resolution and the internal damage-containing portion is imaged at a second pixel resolution higher than the first pixel resolution. On the basis of the visible light images captured using the visible light camera, a damage appearing on a surface of the structure is detected. The information on the internal damage-containing portion in the region to be inspected is acquired by capturing images of the region to be inspected in which the internal state of the region to be inspected is visualized. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2023136030-A1 |
| priorityDate |
2020-05-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |