| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8adaddc602ad7cb7f9e2d550681bb36d |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30024
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10056 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-361
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-367
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0012
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-14
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-06 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-65
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-36
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-06 |
| filingDate |
2020-12-03-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2588c30b0f24d6cee183a73035453a93
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e8c70c6fc3d673e1913361a4d0098199
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f712fc5bf02d5764057e83613d325787
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0ddc744414616afc4703266ef1651f2e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9197241e6baf1376353fc13c7f0dcfb0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5751c6f7d40fab501c118c7422f4a90d |
| publicationDate |
2021-06-10-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2021113421-A1 |
| titleOfInvention |
Apparatus and method of estimating values from images |
| abstract |
A method is used to generate a distortion model for a structured illumination microscopy (SIM) optical system. A sliding window is moved in relation to a plurality of images to define a plurality of sub-tiles. Each sub-tile represents a portion of the corresponding image. Parameters are estimated for each sub-tiles. The parameters include two or more parameters selected from the group consisting of modulation, angle, spacing, phase offset, and phase deviation. A full width at half maximum (FWHM) value associated with each sub-tile is estimated. A distortion model is estimated, based at least in part on a combination of the estimated parameters and FWHM values stored in the predetermined format and an estimated center window parameter. A two-dimensional image may be generated, based at least in part on the estimated distortion model. The two-dimensional image may include representations indicating where distortions occur in the optical system. |
| priorityDate |
2019-12-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |