Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_34c88c465202a4bc7d8388cca9c9bf52 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8887 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-8858 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L22-12 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F18-2433 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-9505 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-9501 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T5-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8851 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06V10-50 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-88 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-95 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-10 |
filingDate |
2020-09-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3b028b1af5ee454de9e6a529e5b853c7 |
publicationDate |
2021-04-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2021062069-A1 |
titleOfInvention |
Equi-probability defect detection |
abstract |
For semiconductor inspection images, detection thresholds can be determined based on probability density functions at a pixel intensity. The detection thresholds can then be applied to an image. This can find outliers at a fixed probability at all pixel intensity levels by estimating the probability distribution of underlying data and adapting the detection threshold values. Laser power can be optimized based on the detection thresholds. |
priorityDate |
2019-09-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |