| abstract |
An apparatus for inspecting a substrate is disclosed. The apparatus for inspecting a substrate may: generate, by using an image of a first substrate, at least one image representing a plurality of second solder pastes in which an anomaly has been detected; apply the generated at least one image to a machine-learning based model; obtain, from the machine-learning based model, a plurality of first values indicating a relationship between each of a plurality of first fault types of a screen printer and the at least one image, and a plurality of first images representing areas associated with one fault type of the plurality of first fault types; determine a plurality of second fault types associated with the plurality of second solder pastes by using the obtained plurality of first values and plurality of first images; and determine at least one third solder paste associated with each of the plurality of second fault types. |