| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_34c88c465202a4bc7d8388cca9c9bf52 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-221
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30148
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10061
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2806
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2817
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2809
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-2448 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-9505
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-222 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-11
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-95 |
| filingDate |
2019-11-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1a1f0f206bf614aa078425134a7acf2
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_8957cff57c50e5af84c33e47bd0c5209
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b4456612364c956b22c63a35eeb697f9 |
| publicationDate |
2020-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2020102611-A1 |
| titleOfInvention |
Using deep learning based defect detection and classification schemes for pixel level image quantification |
| abstract |
A heat map of probable defects in an image can be represented as a matrix of defect probability index corresponding to each pixel. The image may be generated from data received from a detector of a scanning electron microscope or other inspection tools. A number of pixels in the image that exceed a corresponding threshold in the matrix can be quantified. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112884769-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-112884769-B |
| priorityDate |
2018-11-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |