http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020099569-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a2bcaf91101a370a3d64e3190366357f |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-151 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-335 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-0221 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-15 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J5-051 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-67 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-718 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01J3-443 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-33 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-33 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-15 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01J3-443 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-71 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-67 |
| filingDate | 2019-11-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_270e5e3e4f7870ce8bb6d08d126e293a |
| publicationDate | 2020-05-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2020099569-A1 |
| titleOfInvention | Device and method for element analysis of materials by means of optical emission spectroscopy |
| abstract | The invention relates to a device for element analysis of materials by means of optical emission spectroscopy, particularly by means of laser-induced plasma spectroscopy, said device having: means (1) for exciting a plasma (9) from a partial quantity of a measurement object (7) made of the material to be analyzed; means (2a, 2b) for detecting and for spectral analysis of optical radiation (14a) emitted from the plasma (9); beam guidance means for guiding at least a part of the optical radiation (14a) emitted from the plasma (9) to the means (2a, 2b) for detecting and spectral analysis; and means for flushing at least one partial region of the device with an inert gas, wherein the beam guidance means are at least one capillary tube (10a, 10b), which additionally serves to guide the inert gas. The application further relates to a method for element analysis of materials by means of optical emission spectroscopy using the device. |
| priorityDate | 2018-11-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
| Predicate | Subject |
|---|---|
| isDiscussedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/compound/CID5360311 http://rdf.ncbi.nlm.nih.gov/pubchem/substance/SID451572542 |
Total number of triples: 25.