http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020041327-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_605f96781dde5052dff2a2550621775e |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-02327 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-0256 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-0232 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-035281 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L31-0248 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-0256 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-0248 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L31-0232 |
| filingDate | 2019-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2afe8250760b354e5ca3cca6845d35c2 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db54b09d02d2af89f6bf85b28fef24ac http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c106525fb5c5c73749718ce1e82ef57e |
| publicationDate | 2020-02-27-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2020041327-A1 |
| titleOfInvention | High information content imaging using mie photo sensors |
| abstract | A Mie photo sensor is described. A Mie photo sensor is configured to leverage Mie scattering to implement a photo sensor having a resonance. The resonance is based on various physical and material properties of the Mie photo sensor. In an example, a Mie photo sensor includes a layer of semiconductor material with one or more mesas. Each mesa of semiconductor material may include a scattering center. The scattering center is formed by the semiconductor material of the mesa being at least partially surround by a material with a different refractive index than the semiconductor material. The abutting refractive index materials create an interface that forms a scattering center and localizes the generation of free carriers during Mie resonance. One or more electrical contacts may be made to the mesa to measure the electrical properties of the mesa. |
| priorityDate | 2018-08-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 44.