Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_8adaddc602ad7cb7f9e2d550681bb36d |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-082 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16B30-00 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16B40-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-084 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16B20-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-04 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16B40-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G16B30-10 |
classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06N3-04 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G16B20-20 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G16B40-20 |
filingDate |
2019-07-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c6ce9369245d2774bfdf43a1754c4564 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9e0277a5cef160ae3904c48c65931867 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_2e940cb4d9f3147d77faa7f19b9ae43c |
publicationDate |
2020-01-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2020014280-A1 |
titleOfInvention |
DEEP LEARNING-BASED FRAMEWORK FOR IDENTIFYING SEQUENCE PATTERNS THAT CAUSE SEQUENCE-SPECIFIC ERRORS (SSEs) |
abstract |
The technology disclosed presents a deep learning-based framework, which identifies sequence patterns that cause sequence-specific errors (SSEs). Systems and methods train a variant filter on large-scale variant data to learn causal dependencies between sequence patterns and false variant calls. The variant filter has a hierarchical structure built on deep neural networks such as convolutional neural networks and fully-connected neural networks. Systems and methods implement a simulation that uses the variant filter to test known sequence patterns for their effect on variant filtering. The premise of the simulation is as follows: when a pair of a repeat pattern under test and a called variant is fed to the variant filter as part of a simulated input sequence and the variant filter classifies the called variant as a false variant call, then the repeat pattern is considered to have caused the false variant call and identified as SSE-causing. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11783917-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/NL-2023314-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/NL-2023316-B1 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11676685-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11593649-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11515010-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113269675-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113269675-B http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11749380-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11436429-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020191390-A3 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11347965-B2 http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-113469967-A http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11210554-B2 |
priorityDate |
2018-07-11-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |