| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_33c922e05f6133b7d72dbb849d77487d |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-70
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M2010-4271
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-71
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4285 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-48
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2803
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2806
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2812
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2813
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01M10-4285 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-42
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01M10-48 |
| filingDate |
2019-03-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e68f188a566591d7ec1871d6db87cfe2 |
| publicationDate |
2020-01-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2020004774-A1 |
| titleOfInvention |
Apparatus and method for testing circuit board included in battery management system |
| abstract |
Provided are an apparatus and method for testing a circuit board included in a battery management system. The circuit board comprises: a first test point commonly connected to one end of a first resistance element, one end of a first capacitor, and one end of a second resistance element; a second test point commonly connected to the other end of the second resistance element and one end of a second capacitor; a third test point connected to the other end of the first resistance element; and a fourth test point commonly connected to the other end of the first capacitor and the other end of the second capacitor. The apparatus determines an open failure of at least one of the first and second capacitors, on the basis of a first diagnostic voltage between the first and fourth test points and a second diagnostic voltage between the second and fourth test points. |
| priorityDate |
2018-06-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |