http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019232794-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ec28b02734fca6ad0d32d1ff6c9a4b81 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01M11-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01M11-02 |
| filingDate | 2018-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a03e25fbf9d7c4877d5fbd1b18aa305f http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_d9bf54c515c01a008ac20213cc1038a8 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_bc17611ad2d19fa4e4de3fd9d0b7d749 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_3bfcb074fe3ca3b6d4d322fe9d81a902 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_47ebed7defefa821ffc9de3774ab3bc6 |
| publicationDate | 2019-12-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2019232794-A1 |
| titleOfInvention | Test system |
| abstract | A test system for testing a semiconductor laser chip. The test system comprises a loading and unloading device (110), a probe assembly (120) and an integrated sphere assembly (130). The loading and unloading device (110) comprises a plurality of stations (111), and the plurality of stations (111) are used for placing a chip to be tested. The probe assembly (120) comprises several probes (1211), and the several probes (1211) are arranged above the chip to be tested. The integrated sphere assembly (130) comprises an integrated sphere (131), the integrated sphere (131) is provided with an opening (1311), and the opening (1311) is arranged close to the chip to be tested. When a current flows through a pin of the chip to be tested by means of the probe (1211), the opening (1311) receives a light signal sent by the chip to be tested. According to the system, the probe assembly (120) and the integrated sphere assembly (130) are respectively configured to be movable in a vertical direction and a horizontal direction, and in this way, on one hand, a detection element is protected and the service life is prolonged, and on the other hand, a test speed is further improved through ordered motion. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-114295948-A |
| priorityDate | 2018-06-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.