| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_3c2b1a293c37e6b34a820305890d9163 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318547
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-3177
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318555
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318307
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318536
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318371
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-31813
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-318385 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-3185
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate |
2019-03-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5dfc17ccd59f49ba26044b756d707064
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ff29c7307f81c9f551ee7c61efafe3c0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fbd2a3439976d144e09607c073f95d9d
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_c063ea7bb1eaa4a19b7a98dcc06fbeea |
| publicationDate |
2019-09-26-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2019183296-A1 |
| titleOfInvention |
Deterministic stellar built-in self-test |
| abstract |
A system for testing a circuit comprises scan chains, a controller configured to generate a bit-inverting signal based on child test pattern information, and bit-inverting circuitry coupled to the controller and configured to invert bits of a parent test pattern associated with a plurality of shift clock cycles based on the bit-inverting signal to generate a child test pattern during a shift operation. Here, the plurality of shift clock cycles for bit inverting occur every m shift clock cycles, and the child test pattern information comprises information of m and location of the plurality of shift clock cycles in the shift operation. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022082768-A1 |
| priorityDate |
2018-03-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |