| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4a08906e019ce15e60e0fc849b0172c8 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-163
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-1176
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-372
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7275 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-112
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-113
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-1103
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-4094
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V40-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-1122
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-36064
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V40-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B3-145
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7246
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-7264
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61N1-36053
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/A61B5-0077
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V10-764
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06V40-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B5-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/A61B3-113 |
| filingDate |
2019-02-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f7d8eb4e0b0c5251dffe026f9874685e |
| publicationDate |
2019-09-12-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2019173106-A1 |
| titleOfInvention |
Method of detecting and/or predicting seizures |
| abstract |
The methods and systems described herein provide a novel approach for detecting and/or predicting an epileptic event in a subject with or without performing an EEG on the subject. Methods of identifying and treating epilepsy in a subject are also provided herein. A broad regression analysis using a lower order statistical analysis and/or a higher order statistical analysis of one or more oculometric parameters in a time series can be used to determine that the distribution of an oculometric parameter over time and/or the related dependencies of frequencies of two or more oculometric parameters over time correlate with an epileptic event. The methods and systems described herein may also be applied to one or more facial biometrics of the subject. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022196944-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2021163362-A1 |
| priorityDate |
2018-03-09-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |