| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_ebea3ec003d40e41dd9baffbbc0f9a17 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20084
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-20081
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-401
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2223-652
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-10116
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T2207-30128
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N3-045 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-04
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-203
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0008
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06N20-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06T7-0004
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N23-18 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06T7-00 |
| filingDate |
2018-10-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b4632f0812b1ee97642ea4dac14ebea7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_4499577e7c56d5d432f7ccfa8cbfab9e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_ab73a2de4905bf304de352cc2afb8e5c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a130949240c8dd875c612fb17985515e |
| publicationDate |
2019-08-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2019159440-A1 |
| titleOfInvention |
Inspection device |
| abstract |
The purpose of the present invention is to provide an inspection device capable of suppressing deterioration in the accuracy of an inspection of a product including a plurality of articles that can overlap with each other. An X-ray inspection device (10) irradiates a product (G) accommodating a plurality of articles (A) having predetermined shapes, and inspects the product (G) on the basis of an inspection image obtained from light transmitted through the product (G) and light reflected from the product (G). The X-ray inspection device (10) is provided with: a storage unit (51); a learning unit (52c); and an inspection unit (52d). The storage unit (10) stores, as at least a training image, the inspection image of the product (G) in which the plurality of articles (A) overlap each other. By means of machine learning using the training image stored in the storage unit (51), the learning unit (52c) acquires characteristics of the product (G) in which the plurality of articles (A) overlap each other. The inspection unit (52d) inspects the product (G) using the characteristics acquired by the learning unit (52c). |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7295568-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7306925-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022208623-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/KR-102269741-B1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2022070573-A1 |
| priorityDate |
2018-02-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |