http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019100802-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_a62555ff12316a9a118542896b4c0af7 http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c094c8526b300120081f9f27c0ba8f7c |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2648 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2601 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2621 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
| filingDate | 2018-08-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_505b832e151db55d780abea936db11a0 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_34168a8eae7b586c879cc7b53fce799e |
| publicationDate | 2019-05-31-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2019100802-A1 |
| titleOfInvention | Method and device for determining electrical properties of transistor, and storage medium |
| abstract | Disclosed are a method and device for determining electrical properties of a transistor, and a storage medium. The method for determining electrical properties of a transistor comprises: determining transport properties of carriers in a channel of a transistor at an operating temperature of the transistor; and determining electrical properties of the transistor on the basis of the transport properties of the carriers, semiconductor material properties and structural characteristics of the transistor. |
| priorityDate | 2017-11-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 25.