http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019081333-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_cf8a3231cd88b81a086ffdc933fdef2c |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B3-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-294 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-245 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B7-287 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02F1-29 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-361 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-365 |
| classificationIPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B3-14 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-36 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-24 |
| filingDate | 2018-10-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f516e05f5b55f91ab9445fb1311df382 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5eb1f13faf49fde1dd732613f0b00aca http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b8449124c4491650527424606bb93bf7 |
| publicationDate | 2019-05-02-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2019081333-A1 |
| titleOfInvention | AUTOMATIC FOCUSING CONTROL OF A MICROSCOPE COMPRISING AN ELECTRICALLY TUNABLE LENS |
| abstract | A microscope autofocusing device (100) for feedbackly controlling a focal position of an imaging system (220) of a microscope apparatus (200), the imaging system (220) comprising a microscope objective (221), which includes a monitoring beam source (110) for creating a monitoring beam (111), a detector device (120) for detecting a drift variation of an axial lens distance between the microscope objective (221) and a sample (1) by detecting the monitoring beam (111) directed through the imaging system (220) to the sample (1) and reflected by the sample (1). ), and a feedback loop device (130) for controlling the imaging system (220) according to the detected target distance variation of the microscope objective (221), the autofocus device microscope (100) comprising an electrically tuned lens ble (140) configured to be coupled to the microscope objective (221) and adapted to adjust the focal position of the imaging system (220) by varying a lens control input of the electrically tunable lens (140), and the feedback loop device (130) being arranged to control the focal position of the imaging system (220) by controlling the lens control input of the electrically tunable lens (140) based on a value variable setpoint which is determined by actual values of the detected lens distance variation and the lens control input and by calibration data assigning sensor device output values to lens and lens control input values, the calibration data being stored in a calibration data memory coupled to the feedback loop device (130). The invention further relates to a microscope apparatus (200) comprising the microscope autofocusing device (100), an autofocus control method for operating the microscope apparatus and a microscopy method. |
| priorityDate | 2017-10-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 24.