| abstract |
An apparatus (600) for determining, by electric tomography, a vertical profile of an electrical property of interest of one or more materials in a target volume (618) comprising a measurement probe (610) to positioning at a plurality of different measurement levels (650) in a target volume and including a plurality of measuring elements (111) each having an interface surface (112). Each interface surface has a size, a shape and a rotational position. A measurement path (114) is formed between two interface surfaces depending on the dimensions, shapes, and rotational positions of the two interface surfaces and the distance between the two interface surfaces. The locations, rotational positions, shapes, and dimensions of the interface surfaces are selected to provide at least two different measurement paths differing from each other with respect to said sizes, shapes, rotational positions, and / or or distances between the associated interface surfaces. |