http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018229590-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_6b822ee046eb6c45d1e3bd9ce9c1782e |
| classificationCPCAdditional | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M7-16 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-022 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-1012 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F11-1072 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M13-618 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-401 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C11-407 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-023 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G11C29-028 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M7-16 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H03M13-19 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C29-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-407 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F11-10 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G11C11-401 |
| filingDate | 2018-06-04-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_e488ba570f8d9812e017da1ffb7a9130 http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_429b44bc1eaf4f40992c9a144121eb4c |
| publicationDate | 2018-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2018229590-A1 |
| titleOfInvention | Semiconductor device, semiconductor wafer, electronic device, and operation method |
| abstract | Provided is a semiconductor device that performs error detection and correction on multi-valued data. This semiconductor device comprises a first gray code conversion circuit, a second gray code conversion circuit, a gray code reverse conversion circuit, an ECC encoder circuit, an ECC decoder circuit, and a storage unit. When input data is stored in the semiconductor device, the first gray code conversion circuit converts the input data into gray code format data, and the ECC encoder circuit generates inspection data corresponding to the gray code format data. The storage unit stores the input data and the inspection data. When the stored input data is output from the semiconductor device, the second gray code conversion circuit converts the input data, as read from the storage unit, into gray code format data, and the ECC decoder circuit performs error detection and correction on this gray code format data and the inspection data as read from the storage unit. The gray code reverse conversion circuit then converts the corrected data into the same format as the input data. |
| priorityDate | 2017-06-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 49.