| abstract |
A system for processing sample entities includes a chamber including a surface having an array of measurement regions, wherein at least one measurement region comprises a first set of one or more electrodes and a second set of one or more electrodes, wherein the first set of electrodes is configured to measure a first characteristic of a sample entity when the sample entity is traversing the first set of electrodes, and wherein the second set of electrodes is configured to selectively retain the sample entity in the at least one measurement region based at least in part on the measured first characteristic and/or measure a second characteristic of the sample entity. |