http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018156527-A1

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filingDate 2018-02-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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publicationDate 2018-08-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2018156527-A1
titleOfInvention Wellsite kerogen maturity determination utilizing raman spectroscopy
abstract A method for determining thermal maturity of a formation sample. The method includes: cleaning the formation sample to remove residues of drilling fluid and reservoir fluid to obtain a cleaned sample; performing Raman spectroscopic measurements on the cleaned sample to obtain a Raman spectrum for the cleaned sample; fitting at least a G (graphite) peak and a D1 (defect) peak to the Raman spectrum to obtain Raman shift values for the G peak and the D1 peak and a Raman band separation (RBS) value; using the RBS to generate a vitrinite reflection equivalent (V Re ) value using a relationship correlating RBS to V Re ; and displaying the V Re as an indicator of formation sample maturity for a depth in the formation from which the cleaned sample was obtained.
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