http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018075444-A1

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filingDate 2017-10-17-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_087af128bab548f0fe9d05ae6aefbb69
publicationDate 2018-04-26-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2018075444-A1
titleOfInvention Transfer method providing thermal expansion matched devices
abstract A method of transferring an integrated circuit (IC) onto an alternative substrate is provided at a wafer level to enable coefficient of thermal expansion (CTE) matching for a circuit layer to a different material. The method is executable relative to a wafer (11) with a circuit layer (12), a first major surface (121), a second major surface (122) opposite the first major surface, and a substrate (13) affixed to the first major surface. The method includes temporarily bonding a handle (14) to the second major surface, removing a majority of the substrate to expose the first major surface and bonding a second substrate (16) to the first major surface with deposited bonding material (15).
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-7143182-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2020068250-A
priorityDate 2016-10-21-04:00^^<http://www.w3.org/2001/XMLSchema#date>
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Total number of triples: 32.