| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_61f88efcda59d7062a4252ecf6886f58 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0048
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-6463
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2201-105 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B27-58
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-6458
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-648
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-16
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0032
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0076
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-0044
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B21-36 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B21-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B26-10
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B27-58 |
| filingDate |
2017-08-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1c7bde3dc42d65e4d9252754b268df9e
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_aebde77e2fd3919c6d5e9854fd6ec6c0
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b78d115a7bfa1ea60b5e9f8b504894df
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_f1e27527efff13076a7bda620cf414f6
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b941354c43507a99cf59300e1e8722cd
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_af20451829ae595993745a87091608a7 |
| publicationDate |
2018-03-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2018039361-A1 |
| titleOfInvention |
Systems and methods for instant total internal reflection fluorescence/structured illumination microscopy |
| abstract |
Embodiments related to systems and methods for instant structured microscopy where total internal reflection fluorescence techniques are used to improve optical sectioning and signal-to-noise ratio of structured illumination microscopy are disclosed. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109211854-A
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109211854-B
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/CN-109188667-A |
| priorityDate |
2016-08-23-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |