| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c1755eede76ea7e719a3e0d2843cd793 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06733 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07357
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R3-00
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2886
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-06755
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-07307
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0735
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R1-0483 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-06
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R1-073
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L21-66 |
| filingDate |
2017-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7ee4bdbdddc804223eaf84a89377f972
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0ca579c959e06f7b87a75d7a58ccd923 |
| publicationDate |
2018-02-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2018030438-A1 |
| titleOfInvention |
Conduction inspection device member and conduction inspection device |
| abstract |
Provided is a conduction inspection device member: that has conductive parts that do not readily crack or develop voids; that does not readily experience impairment of conductive performance, even after repeated conduction inspections; and that is not readily left with contact marks at a portion thereof that contacts inspected members. Also provided is a conduction inspection device that comprises the conduction inspection device member. A conduction inspection device member that comprises a substrate 13, through holes 11, and conductive parts 12. The through holes 11 are arranged in the substrate 13, and the conductive parts 12 are housed inside the through holes 11. The conductive parts 12 include conductive particles 2. The conductive particles 2 comprise a substrate particle 21 and a conductive layer 22 that is arranged upon the surface of the substrate particle 21. The conductive layer 22 has protrusions 23 on the outer surface thereof. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019107572-A1 |
| priorityDate |
2016-08-08-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |