http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2018025683-A1

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filingDate 2017-07-24-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_db1c50f0cede7226939178d7329f26e5
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publicationDate 2018-02-08-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2018025683-A1
titleOfInvention Probe card and inspection method
abstract A probe card (100) according to the present invention inspects a work (50) that has a plurality of pads (51). The probe card (100) is provided with: a planar secondary battery (10) that comprises a planar electrode (22) and is arranged such that the planar electrode (22) faces the work (50); and an electrical connector (30) that is arranged between the work (50) and the secondary battery (10). The secondary battery (10) has a structure wherein a wiring line is able to be led out from the planar electrode (22) at an arbitrary position. The electrical connector (30) has a plurality of contacts (31) which protrude toward the facing pads (51); and the plurality of pads (51) and the planar electrode (22) are electrically connected to each other via the plurality of contacts (31).
isCitedBy http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2019230216-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/JP-2019207907-A
priorityDate 2016-08-02-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

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Total number of triples: 32.