| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_1b0c198757da18cf77dfbdcef00abb70 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J2237-002
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L2300-1894 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L7-50
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L3-5085
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-023
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N30-12
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01J37-20
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B01L9-523
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-312
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N1-2813 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N1-28 |
| filingDate |
2017-07-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_42720763f0e54b95de75c710e05b9c2c
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7f338ceaf7c3834a7f9df25276dcd845
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eb29b1b3bf4451ea57b86812dc09583b |
| publicationDate |
2018-02-01-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2018020036-A1 |
| titleOfInvention |
Electron microscopy |
| abstract |
Aspects and embodiments relate to electron microscopy sample preparation apparatus; and a method of preparing an electron microscopy sample. Aspects and embodiments provide electron microscopy sample preparation apparatus. The apparatus comprises a support holder configured to receive an electron microscopy sample support, the electron microscopy sample support configured to receive a fluid sample. The apparatus comprising a gas outlet configured to direct a flow of gas towards a surface of the electron microscopy sample support to adjust fluid supported by the electron microscopy sample support. Aspects and embodiments recognise that in order to be successfully imaged, a specimen must be adequately prepared for imaging. Successful and reproducible preparation of an electron microscopy sample or specimen may be key to obtaining useful results from microscopy techniques. It will be appreciated that incorrect or unsuccessful preparation of a specimen for examination, may result in damage to a specimen, poor and/or irreproducible results. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-4109069-A1
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11668720-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/EP-3647763-A1 |
| priorityDate |
2016-07-29-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |