| abstract |
The present invention relates to a mass spectrometry method including the use of transition reactions of charged particles to selectively ionize a target compound from a sample mixture in which a sample, including the target compound and one or more interfering compounds, is mixed with an additive having a higher charged particle affinity than the one or more interfering compounds. According to a mass spectrometry method of the present invention, the sensitivity by which ions originating from a target compound in a sample are analyzed by a mass spectrometer may be selectively enhanced by efficiently controlling the ionization of interfering compounds — which are in the sample but are not the target compound — caused by transition reactions of charged particles, such as protons, electrons, etc., accompanying the prescribed addition of additives. |