| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_abf34d5451afb71e51348dcd0f446875 |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-645
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N2021-054
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-643
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-783 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-15
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-274
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N27-404
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01N21-8507 |
| classificationIPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-64
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-78 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-27
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N21-85
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01N27-00 |
| filingDate |
2017-02-16-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_001b14d9d3eb8343547c45c5ee060d81
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a725fd5cc6b1aefbd7c7f5a27835b273
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b7e68761d0cb11ed3af9f4f5bf12b535
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_1b6588365685f9cc68bd68168566bc80
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_a6c05238f0bdec068104cac4be2ae71f
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_08dd204915c4d69cd2ec7a7c14ce19a7
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_5bde226a900fd4981fe74883158098fa
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_fc58a3a9982f10568d7f6a9dbc83f4ff |
| publicationDate |
2017-08-24-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2017143101-A1 |
| titleOfInvention |
Methods and apparatus for reducing measurement artifacts of sensor measurements |
| abstract |
Methods and apparatus for reducing measurement artifacts of sensor measurements are disclosed herein. An aspect of the invention includes a measurement device configured to reduce measurement inaccuracies in a sample. The measurement device comprises a measurement probe comprising a sensor configured to detect a characteristic of the sample and generate a measurement signal based thereon. The measurement device further comprises a memory configured to store instructions for applying a filter to the measurement signal. The measurement device also further comprises a filtering module configured to process the instructions for applying the filter to the measurement signal to generate a filtered output with reduced measurement inaccuracies. |
| priorityDate |
2016-02-18-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |