http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2017115027-A1

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filingDate 2016-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eac1572c537156d42bc3fdd9e2ef1b44
publicationDate 2017-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2017115027-A1
titleOfInvention Integrated circuit intended for insulation defect detection and having a conductive armature
abstract The invention relates to an electronic circuit (1) including: an electronic component (11), a conductive armature (4) surrounding the electronic component, an electrical insulator (5) between the electronic component (11) and the conductive armature (4), a device (7) configured to measure the current passing through the armature (4) or the voltage on said armature or on the electronic component, and a defect determination device (8) configured to determine a defect in the electrical insulator (5) on the basis of the measured current or voltage.
priorityDate 2015-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date>
type http://data.epo.org/linked-data/def/patent/Publication

Incoming Links

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Total number of triples: 28.