Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_d3fc9711989b2c07e13453d9e6a734d3 |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-32 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B45-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2635 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2839 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05B45-54 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-006 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-52 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2841 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G09G3-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R31-2801 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H05B44-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G09G3-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-28 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R31-26 |
filingDate |
2016-12-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_eac1572c537156d42bc3fdd9e2ef1b44 |
publicationDate |
2017-07-06-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2017115027-A1 |
titleOfInvention |
Integrated circuit intended for insulation defect detection and having a conductive armature |
abstract |
The invention relates to an electronic circuit (1) including: an electronic component (11), a conductive armature (4) surrounding the electronic component, an electrical insulator (5) between the electronic component (11) and the conductive armature (4), a device (7) configured to measure the current passing through the armature (4) or the voltage on said armature or on the electronic component, and a defect determination device (8) configured to determine a defect in the electrical insulator (5) on the basis of the measured current or voltage. |
priorityDate |
2015-12-28-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |