| abstract |
An embodiment of the present invention provides an apparatus for detecting sample properties, which comprises: a wave source for radiating waves toward a sample; a detection unit for detecting a laser speckle generated by multiple scattering of the radiated waves, caused by the sample, wherein the laser speckle is detected at each predetermined time point; and a control unit for acquiring a temporal correlation which is a change over time in the detected laser speckle, and detecting the properties of the sample in real time on the basis of the acquired temporal correlation, wherein the detection unit detects the laser speckle in one area between the sample and the detection unit or inside the detection unit. |