http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2017053685-A1

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filingDate 2016-09-23-04:00^^<http://www.w3.org/2001/XMLSchema#date>
inventor http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_17da97d1fc1d91b82c1be7d15c469d33
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publicationDate 2017-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date>
publicationNumber WO-2017053685-A1
titleOfInvention Polyurethane cmp pads having a high modulus ratio
abstract A chemical-mechanical polishing pad comprising a polyurethane polishing layer having a high storage modulus at low temperatures and a low storage modulus at high temperatures is disclosed. For example, the disclosed pad embodiments may be fabricated from a thermoplastic polyurethane having a ratio of storage modulus at 25 degrees C to storage modulus at 80 degrees C of 50 or more. The thermoplastic polyurethane polishing layer may further optionally have a Shore D hardness of 70 or more, a tensile elongation of 320 percent or less, a storage modulus at 25 degrees C of 1200 MPa or more, and/or a storage modulus at 80 degrees C of 15 MPa or less.
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