| Predicate |
Object |
| assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_4a95eddc9aa3f6e359263b1cff8bf9e3
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_37f4922dfb7777b019e504b885211b8e |
| classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01D5-35383
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-183
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S3-08027
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S3-08054
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K11-322
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-041 |
| classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-1096
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01D5-35364
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K11-322
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01L1-242
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01K11-32
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01S5-141 |
| classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01D5-353 |
| filingDate |
2016-09-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_7b7d322723a09c7d6803e8a5280392eb
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_059261e43fd513bb728b5595af5e19ae |
| publicationDate |
2017-03-30-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber |
WO-2017051119-A1 |
| titleOfInvention |
Measurement system and temperature and/or shape change sensor using brillouin back-reflection analysis |
| abstract |
The invention relates to a measurement system using Brillouin back-reflection analysis and including a laser emission device (10) configured to emit an incident wave (v0) and a reference wave (v0-vB). The incident wave has an incident frequency (v0), and the reference wave has a reference frequency (v0-vB). The reference frequency (v0-vB) is shifted from the incident frequency (v0) by a predetermined value (vB). The system is configured to: project the incident wave (v0) into the optical fiber (25), receive a back-reflected wave (v0-vS) in return, generate a composite wave (v0-S; 0-B) combining the back-reflected wave (v0-vS) and the reference wave (v0-vB), and determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave (v0-S; 0-B). Advantageously, the incident wave and the reference wave come from a dual-frequency, vertical-cavity surface-emitting laser source (12), which is part of the laser emission device. |
| isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11536560-B2
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2020042999-A1 |
| priorityDate |
2015-09-22-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type |
http://data.epo.org/linked-data/def/patent/Publication |