http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2016114074-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_c97f90ab12b35b650d5fd039ed7a41a5 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G02B5-30 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F3-041 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G06F3-044 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F3-041 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G06F3-044 http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G02B5-30 |
| filingDate | 2015-12-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_9eef377c15fc3699c506dcbc5a9c9fae |
| publicationDate | 2016-07-21-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2016114074-A1 |
| titleOfInvention | Touch sensor with integrated polarizing plate and method for manufacturing same |
| abstract | The objective of the present invention is to provide: a touch sensor with an integrated polarizing plate, wherein deformation of the polarizing plate within the touch sensor is suppressed even under environmental variation such as high temperature and high humidity, so that malfunction or deterioration of the sensor detection sensitivity of a transparent conductive layer due to the deformation is suppressed; and a method for manufacturing this touch sensor with an integrated polarizing plate. A touch sensor with an integrated polarizing plate according to the present invention is characterized by comprising at least a transparent conductive layer, a base film A, a polarizer, a base film B and an adhesive layer in this order, and is also characterized in that: the base film A contains a cycloolefin polymer, which is a main component, and an additive that is different from the cycloolefin polymer; the concentration of the additive in the base film A in the polarizer-side surface and the concentration of the additive in the base film A in the transparent conductive layer-side surface are different by 1.1 times or more; and the in-plane retardation Ro of the base film A as measured at a light wavelength of 550 nm in an environment at a temperature of 23°C and at a relative humidity of 55% is within the range of 50-200 nm. |
| priorityDate | 2015-01-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
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