Predicate |
Object |
assignee |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_0f1ec8d7809fa344da70eb2ef32cee7e |
classificationCPCAdditional |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0278 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0214 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0228 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2207-09 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L2924-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0257 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2207-012 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2207-05 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0207 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B2201-0264 |
classificationCPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-308 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N59-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H05K7-02 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N19-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10B61-00 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H01L27-14 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/H10N30-302 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/B81B7-02 |
classificationIPCInventive |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/H01L27-14 |
filingDate |
2014-03-13-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
inventor |
http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_0c23ddc5b049e6f9b43590c920c3cf3c |
publicationDate |
2016-04-14-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
publicationNumber |
WO-2016057007-A1 |
titleOfInvention |
Monolithically integrated multi-sensor device on a semiconductor substrate and method therefor |
abstract |
An integrated circuit having an indirect sensor and a direct sensor formed on a common semiconductor substrate is disclosed. The direct sensor requires the parameter being measured to be directly applied to the direct sensor. Conversely, the indirect sensor can have the parameter being measured to be indirectly applied to the indirect sensor. The parameter being measured by the direct sensor is different than the parameter being measured by the indirect sensor. In other words, the direct sensor and indirect sensor are of different types. An example of a direct sensor is a pressure sensor. The pressure being measured by the pressure sensor must be applied to the pressure sensor. An example of an indirect sensor is an accelerometer. The rate of change of velocity does not have to be applied directly to the accelerometer. In one embodiment, the direct and indirect sensors are formed using photolithographic techniques. |
isCitedBy |
http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-11543127-B2 |
priorityDate |
2013-03-15-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
type |
http://data.epo.org/linked-data/def/patent/Publication |