http://rdf.ncbi.nlm.nih.gov/pubchem/patent/WO-2015090478-A1
Outgoing Links
| Predicate | Object |
|---|---|
| assignee | http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_28bac77871c584a68a4f8155870e474e http://rdf.ncbi.nlm.nih.gov/pubchem/patentassignee/MD5_9d527f9a5c3e991a1797de3518a88d14 |
| classificationCPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-32 http://rdf.ncbi.nlm.nih.gov/pubchem/patentcpc/G01R27-28 |
| classificationIPCInventive | http://rdf.ncbi.nlm.nih.gov/pubchem/patentipc/G01R27-32 |
| filingDate | 2013-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| inventor | http://rdf.ncbi.nlm.nih.gov/pubchem/patentinventor/MD5_b7d60ce89ff716ac6c2fec5a15fb3e63 |
| publicationDate | 2015-06-25-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| publicationNumber | WO-2015090478-A1 |
| titleOfInvention | Multi-port measurement technique for determining s-parameters |
| abstract | This invention relates to an apparatus (7), a method and a computer program for calculating one or more scattering parameters of a linear network (1, 8), which are related to a reference impedance, on the basis of a measured electrical response at one or more ports (4, 5) of the linear network (1, 8) to an incident wave applied at a port (4) of the linear network (1, 8), measured under the condition that one or more of other ports (6a, 6b, 6c) of the linear network (1, 8) face a reflection coefficient r with an amplitude p of 0.5 or larger. |
| isCitedBy | http://rdf.ncbi.nlm.nih.gov/pubchem/patent/US-10901017-B2 |
| priorityDate | 2013-12-20-04:00^^<http://www.w3.org/2001/XMLSchema#date> |
| type | http://data.epo.org/linked-data/def/patent/Publication |
Incoming Links
Total number of triples: 27.